logo
calendar27 Mart 2022
view35
Asosiy til:Ingliz

DEFECT STRUCTURE OF SILICON WITH AN IMPURITY OF TUNGSTEN UNDER THE INFLUENCE OF EXTERNAL FACTORS

Fan yo'nalishi:
pdf

file.pdf

PDF

MAQOLA ANNOTATSIYASI

quote
Anotatsiya mavjud emas

MUALLIFLAR

SH.Daliev

Semiconductor Physics and Microelectronics Research Institute

SHU JURNALDAGI BOSHQA MAQOLALAR

Maqolani baholang

0
0 ta baho
5
4
3
2
1

Maqola idintifikatorlari

Foydalanilgan adabiyotlar