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DETERMINING THE LIFETIME OF MINORITY CHARGE CARRIERS AND IRON IMPURITY CONCENTRATION IN SEMICONDUCTOR STRUCTURES WITH SUBMICRON LAYERS
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DETERMINING THE LIFETIME OF MINORITY CHARGE CARRIERS AND IRON IMPURITY CONCENTRATION IN SEMICONDUCTOR STRUCTURES WITH SUBMICRON LAYERS
239
Name of journal
Физика полупроводников и микроэлектроника
Number of edition
2020, том 2, выпуск 4
View count
239
Web Address
https://uzjournals.edu.uz/semiconductors/vol2/iss4/3/
DOI
Date of creation in the UzSCI system
28-03-2022
Read count
0
Date of publication
25-08-2020
Main Language
Ingliz
Pages
18-21
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№
Author name
position
Name of organisation
1
Zharin A..
scienstist
Belarusian National Technical University
№
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