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PHOTOELECTRIC MEASUREMENTS OF SELENIUM DOPED SILICON
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PHOTOELECTRIC MEASUREMENTS OF SELENIUM DOPED SILICON
285
Name of journal
Физика полупроводников и микроэлектроника
Number of edition
2020, том 2, выпуск 4
View count
285
Web Address
https://uzjournals.edu.uz/semiconductors/vol2/iss4/4/
DOI
Date of creation in the UzSCI system
28-03-2022
Read count
0
Date of publication
25-08-2020
Main Language
Ingliz
Pages
22-24
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№
Author name
position
Name of organisation
1
Mavlyanov A. .
scienstist
tate Enterprise “ Uzbek Japan Innovation Center of Youth”
№
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