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STRUCTURAL FEATURES OF THE THIN-FILM N-ZnO/P-Si HETEROJUNCTION
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STRUCTURAL FEATURES OF THE THIN-FILM N-ZnO/P-Si HETEROJUNCTION
276
Name of journal
Физика полупроводников и микроэлектроника
Number of edition
2020, том 2, выпуск 4
View count
276
Web Address
https://uzjournals.edu.uz/semiconductors/vol2/iss4/5/
DOI
Date of creation in the UzSCI system
28-03-2022
Read count
0
Date of publication
25-08-2020
Main Language
Ingliz
Pages
25-28
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№
Author name
position
Name of organisation
1
Rembeza S..
scienstist
Voronezh State Technical University
№
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