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Publisher info
Name:OʻzMU huzuridagi Yarimoʻtkazgichlar fizikasi va mikroelektronika ITI
Address:100057, Toshkent sh., Olmazor tum., Yangi Olmazor koʻchasi, 20 uy.
Phone: +998 71 248 79 94
Email: ispm_uz@mail.ru
| Name | 2020, том 2, выпуск 3 | ||
| Journal | Физика полупроводников и микроэлектроника | ||
| Volume Number | 2 | ||
| Published At | 25/06/2020 | ||
| Pages | 70 | ||
| Issue Number | 3 | ||
| Total number | 6 | ||
| File | |||
| The full name of the article | Language | Pages | View count | Read count |
|---|---|---|---|---|
|
MULTICHANNEL OPTICAL SPECTRUM RECORDER FOR MICROELEMENTS DETERMINATION Физика полупроводников и микроэлектроника |
Ingliz | 27-31 | 68 | 0 |
|
HUMIDITY SENSORS BASED ON COMPOSITE MATERIAL WITH NANO-DIMENSIONAL STRUCTURES Физика полупроводников и микроэлектроника |
Rus | 32-35 | 232 | 0 |
|
NEW SCIENTIFIC DIRECTION OF SEMICONDUCTOR PHYSICS: NATURAL SEMICONDUCTORS Физика полупроводников и микроэлектроника |
Ingliz | 36-39 | 186 | 0 |
|
DEFECT STRUCTURE OF SILICON WITH AN IMPURITY OF TUNGSTEN UNDER THE INFLUENCE OF EXTERNAL FACTORS Физика полупроводников и микроэлектроника |
Ingliz | 40-42 | 266 | 0 |
|
TECHNOLOGICAL FEATURES OF OBTAINING STRENGTH SENSITIVE POLYCRYSTALLINE FILMS Bi2-XSbXTe3 Физика полупроводников и микроэлектроника |
Ingliz | 43-45 | 124 | 0 |