Thin metal-oxide layers of ZnO on the silicon substrate obtained by spray pyrolysis and optimal technological modes determined. It was determined that, obtained ZnO films based on silicon have a hexagonal syngony, a wurzite structure with lattice parameters, а = 0.3265 nm and c = 0.5212 nm, with block sizes of 67 nm.
Получены тонкие металлооксидные слои ZnO на подложке кремния, методом спрей-пиролиза и определены оптимальные технологические режимы. Обнаружены, что полученные пленки ZnO на основе кремния имеют гексагональную сингонию, типа вюрцитная структура с параметрами решетки, а = 0.3265 нм и c = 0.5212 нм, с размерами блоков 67 нм.
Thin metal-oxide layers of ZnO on the silicon substrate obtained by spray pyrolysis and optimal technological modes determined. It was determined that, obtained ZnO films based on silicon have a hexagonal syngony, a wurzite structure with lattice parameters, а = 0.3265 nm and c = 0.5212 nm, with block sizes of 67 nm.
№ | Имя автора | Должность | Наименование организации |
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1 | Boboev A.Y. | ||
2 | Rembeza S.. | ||
3 | Men'shikova T.. | ||
4 | Svistova T.. |
№ | Название ссылки |
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