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Jurnal
Yarimoʻtkazgichlar fizikasi va mikroelektronika
Jurnalga o‘tish
2020, том 2, выпуск 4
Chiqarilgan sana
25 Avgust 2020
Jild
2
Son
№4
ISSN
2181-9947
Tegishli maqolalar
Jami: 16 ta
11
COMPACT SPECKLE INTERFEROMETER FOR DIGITAL SHEAROGRAPHY
Yarimoʻtkazgichlar fizikasi va mikroelektronika
ROI:
https://eroi.uz/11.0066/A0322-0007
DOI:
Mavjud emas
28 Mart 2022
27
PDF ko'rish
12
INVESTIGATION OF RECOMBINATIONAL PROCESSES THROUGH PHOTOELECTRIC CONDUCTIVITY OF THE FILM OF HYDROGENATED AMORPHOUS SILICON AND ITS MODIFICATION
Yarimoʻtkazgichlar fizikasi va mikroelektronika
ROI:
https://eroi.uz/11.0066/A0322-0013
DOI:
Mavjud emas
28 Mart 2022
32
PDF ko'rish
13
STRUCTURAL FEATURES OF THE THIN-FILM N-ZnO/P-Si HETEROJUNCTION
Yarimoʻtkazgichlar fizikasi va mikroelektronika
ROI:
https://eroi.uz/11.0066/A0322-0014
DOI:
Mavjud emas
28 Mart 2022
28
PDF ko'rish
14
SCANNING PHOTOSTIMULATED ELECTROMETRY FOR TESTING THE UNIFORMITY OF SPATIAL DISTRIBUTION OF SEMICONDUCTOR WAFERS PARAMETERS
Yarimoʻtkazgichlar fizikasi va mikroelektronika
ROI:
https://eroi.uz/11.0066/A0322-0019
DOI:
Mavjud emas
28 Mart 2022
31
PDF ko'rish
15
POSSIBILITIES OF USING HIGHLY COMPENSATED SILICON IN ELECTRONICS
Yarimoʻtkazgichlar fizikasi va mikroelektronika
ROI:
https://eroi.uz/11.0066/A0322-0020
DOI:
Mavjud emas
28 Mart 2022
32
PDF ko'rish
16
PHOTOELECTRIC MEASUREMENTS OF SELENIUM DOPED SILICON
Yarimoʻtkazgichlar fizikasi va mikroelektronika
ROI:
https://eroi.uz/11.0066/A0322-0009
DOI:
Mavjud emas
28 Mart 2022
35
PDF ko'rish
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