В работе рассмотрено влияние скоплений примесных атомов никеля на структуру монокристаллического кремния. С помощью метода электронно-зондового микроанализа изучены типичные свойства дислокационных линий, образующихся вокруг скоплений примесных атомов никеля в кремнии.
The effect of clusters of nickel impurity atoms on the structure of single-crystal silicon is considered. Using the electron probe microanalysis method, the typical properties of dislocation lines formed around clusters of nickel impurity atoms in silicon are studied.
№ | Author name | position | Name of organisation |
---|---|---|---|
1 | Turgunov N.. | ||
2 | Zainabidinov S.Z. | ||
3 | Akbarov S.. | ||
4 | Berkinov E.. |
№ | Name of reference |
---|---|
1 | Reyvi K. Defects and impurities in semiconductor silicon. –M .: World. 1984. -470 p. |
2 | Nikolaeva EA Shear mechanisms of plastic deformation of single crystals. // Tutorial. Publishing house of Perm State Technical University. 2011. -50 p. |
3 | Baraz V.R., Levchenko V.P., Povzner A.A. The structure and physical properties of crystals // Textbook. Ekaterinburg: USTU-UPI, 2009. -164 p. |
4 | Talanin V.I., Talanin I.E. To the question of the correspondence of the hightemperature precipitation model to the classical theory of nucleation // FTT. 2014. Volume 56. Issue. 10, pp. 78-84. |
5 | Kveder V., Khorosheva M., Seibt M. Interplay of Ni and Au atoms with dislocations and vacancy defects generated by moving dislocations in Si. // Solid State Phenomena. 2016. Vol. 242. pp. 147-154. |