333

  • Name of journal
  • Number of edition
  • View count 333
  • Web Address
  • DOIdoi.org/10.47100/conference_physics/S2_17
  • Date of creation in the UzSCI system 20-08-2020
  • Read count 233
  • Date of publication
  • Main LanguageO'zbek
  • Pages109-113
Tags
Русский

В работе рассмотрено влияние скоплений примесных атомов никеля на структуру монокристаллического кремния. С помощью метода электронно-зондового микроанализа изучены типичные свойства дислокационных линий, образующихся вокруг скоплений примесных атомов никеля в кремнии.

English

The effect of clusters of nickel impurity atoms on the structure of single-crystal silicon is considered. Using the electron probe microanalysis method, the typical properties of dislocation lines formed around clusters of nickel impurity atoms in silicon are studied.

Author name position Name of organisation
1 Turgunov N..
2 Zainabidinov S.Z.
3 Akbarov S..
4 Berkinov E..
Name of reference
1 Reyvi K. Defects and impurities in semiconductor silicon. –M .: World. 1984. -470 p.
2 Nikolaeva EA Shear mechanisms of plastic deformation of single crystals. // Tutorial. Publishing house of Perm State Technical University. 2011. -50 p.
3 Baraz V.R., Levchenko V.P., Povzner A.A. The structure and physical properties of crystals // Textbook. Ekaterinburg: USTU-UPI, 2009. -164 p.
4 Talanin V.I., Talanin I.E. To the question of the correspondence of the hightemperature precipitation model to the classical theory of nucleation // FTT. 2014. Volume 56. Issue. 10, pp. 78-84.
5 Kveder V., Khorosheva M., Seibt M. Interplay of Ni and Au atoms with dislocations and vacancy defects generated by moving dislocations in Si. // Solid State Phenomena. 2016. Vol. 242. pp. 147-154.
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