logo
Semiconductor Physics and Microelectronics
Journal
Semiconductor Physics and Microelectronics
Go to journal
Issue cover

2020, том 2, выпуск 4

Published date
25 Avgust 2020
Volume
2
Issue
№4
ISSN
2181-9947

Related articles

Total: 16 items
1

INFLUENCE OF HIGH RADIATION DOSES ON THE BEHAVIOR OF TRANSITION ELEMENT IMPURITIES IN SILICON

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0021
DOI:Not Available
calendar28 Mart 2022
view26
2

NEW ENERGY AND RESOURCE SAVING TECHNOLOGIES FOR PRODUCING SILICON AND ITS ALLOYS

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0017
DOI:Not Available
calendar28 Mart 2022
view32
3

THE POSITIVE FEEDBACK AMPLIFICATION MECHANISM OF THE INJECTION PHOTODIODE BASED ON LARGE-BLOCK CdTe FILMS

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0010
DOI:Not Available
calendar28 Mart 2022
view30
4

CRITERIA FOR OBTAINING COMPENSATED NICKEL SILICON

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0018
DOI:Not Available
calendar28 Mart 2022
view29
5

IMPROVING THE PHOTOELECTRIC CHARACTERISTICS OF THIN-FILM SOLAR CELLS THE BASED CDTE BY DOPING WITH COPPER THE BASE LAYER OF CADMIUM TELLURIDE

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0022
DOI:Not Available
calendar28 Mart 2022
view25
6

RESEARCH OF PHOTOELECTRIC PROPERTIES OF A GAS DISCHARGE CELL WITH PHOTOELECTRODES BASED ON GALLIUM ARSENIDE AND SILICON WITH PLASMA CONTACTS

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0012
DOI:Not Available
calendar28 Mart 2022
view25
7

INVESTIGATION OF DEFECT FORMATION PROCESSES IN SILICON WITH IRON IMPURITY

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0004
DOI:Not Available
calendar28 Mart 2022
view32
8

DETERMINING THE LIFETIME OF MINORITY CHARGE CARRIERS AND IRON IMPURITY CONCENTRATION IN SEMICONDUCTOR STRUCTURES WITH SUBMICRON LAYERS

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0005
DOI:Not Available
calendar28 Mart 2022
view26
9

COMPACT SPECKLE INTERFEROMETER FOR DIGITAL SHEAROGRAPHY

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0007
DOI:Not Available
calendar28 Mart 2022
view26
10

INVESTIGATION OF RECOMBINATIONAL PROCESSES THROUGH PHOTOELECTRIC CONDUCTIVITY OF THE FILM OF HYDROGENATED AMORPHOUS SILICON AND ITS MODIFICATION

Semiconductor Physics and Microelectronics
ROI: https://eroi.uz/11.0066/A0322-0013
DOI:Not Available
calendar28 Mart 2022
view31