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DETERMINING THE LIFETIME OF MINORITY CHARGE CARRIERS AND IRON IMPURITY CONCENTRATION IN SEMICONDUCTOR STRUCTURES WITH SUBMICRON LAYERS
Bosh sahifa
Maqolalar
DETERMINING THE LIFETIME OF MINORITY CHARGE CARRIERS AND IRON IMPURITY CONCENTRATION IN SEMICONDUCTOR STRUCTURES WITH SUBMICRON LAYERS
214
Jurnal nomi
Физика полупроводников и микроэлектроника
Nashr soni
2020, том 2, выпуск 4
Ko'rishlar soni
214
Internet havola
https://uzjournals.edu.uz/semiconductors/vol2/iss4/3/
DOI
UzSCI tizimida yaratilgan sana
28-03-2022
O'qishlar soni
0
Nashr sanasi
25-08-2020
Asosiy til
Ingliz
Sahifalar
18-21
Kalit so'z
Annotatsiyalar
Mualliflar
Foydalanilgan adabiyotlar
Hujjatni onlayn ko'rish
№
Muallifning F.I.Sh.
Lavozimi
Tashkilot nomi
1
Zharin A..
scienstist
Belarusian National Technical University
№
Havola nomi
Kutilmoqda