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Semiconductor Physics and Microelectronics
Semiconductor Physics and Microelectronics
SPM
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Publisher:
Oʻzbekiston Milliy universiteti huzuridagi Yarimoʻtkazgichlar fizikasi va mikroelektronika ilmiy-tadqiqot instituti
Online ISSN:
2181-9947
Print ISSN:
2181-9947
Established:
2019
Views:
411
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1
THE POSITIVE FEEDBACK AMPLIFICATION MECHANISM OF THE INJECTION PHOTODIODE BASED ON LARGE-BLOCK CdTe FILMS
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0010
DOI:
Not Available
28 Mart 2022
32
View PDF
2
NEW ENERGY AND RESOURCE SAVING TECHNOLOGIES FOR PRODUCING SILICON AND ITS ALLOYS
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0017
DOI:
Not Available
28 Mart 2022
33
View PDF
3
DETERMINING THE LIFETIME OF MINORITY CHARGE CARRIERS AND IRON IMPURITY CONCENTRATION IN SEMICONDUCTOR STRUCTURES WITH SUBMICRON LAYERS
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0005
DOI:
Not Available
28 Mart 2022
28
View PDF
4
STRUCTURAL FEATURES OF THE THIN-FILM N-ZnO/P-Si HETEROJUNCTION
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0014
DOI:
Not Available
28 Mart 2022
30
View PDF
5
THE INFLUENCE OF THE MICROWAVE FIELD ON THE CHARACTERISTICS OF THE p-n JUNCTION
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0006
DOI:
Not Available
28 Mart 2022
31
View PDF
6
COMPACT SPECKLE INTERFEROMETER FOR DIGITAL SHEAROGRAPHY
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0007
DOI:
Not Available
28 Mart 2022
28
View PDF
7
INVESTIGATION OF RECOMBINATIONAL PROCESSES THROUGH PHOTOELECTRIC CONDUCTIVITY OF THE FILM OF HYDROGENATED AMORPHOUS SILICON AND ITS MODIFICATION
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0013
DOI:
Not Available
28 Mart 2022
34
View PDF
8
INVESTIGATION OF DEFECT FORMATION PROCESSES IN SILICON WITH IRON IMPURITY
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0004
DOI:
Not Available
28 Mart 2022
34
View PDF
9
PHOTOELECTRIC MEASUREMENTS OF SELENIUM DOPED SILICON
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0009
DOI:
Not Available
28 Mart 2022
37
View PDF
10
CRITERIA FOR OBTAINING COMPENSATED NICKEL SILICON
Semiconductor Physics and Microelectronics
ROI:
https://eroi.uz/11.0066/A0322-0018
DOI:
Not Available
28 Mart 2022
31
View PDF
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